CANCELLED Neutron-induced faults in computing devices: from errors in user applications to large-server operations corruption and cars or airplanes accidents.
CANCELLED: This talk has sadly had to be postponed. An alternative lecture is being sought. Please check this page for updates
Dr Paolo Rech, Los Alamos National Laboratory, USA
A neutron can generate faults in electronic devices, leading to application crashes, wrong results, and system hangs. In the talk we will discuss how to measure the expected error rate of a device and how to design hardening solutions to detect and eventually correct neutron-induced faults.
Lectures held at 6.30pm. Refreshments are served from 6pm on the day of the lecture. Please register online here to attend lectures.
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